发明名称 X-RAY INTENSITY MEASUREMENT METHOD AND MEASURING DEVICE
摘要 PURPOSE:To sufficiently measure X-ray intensity even if gas pressure is lowered by applying a specified magnetic field between both parallel flat plate electrodes when X-rays are passed between the parallel flat plate electrodes arranged in a space in which an ionization gas is enclosed to measure its strength. CONSTITUTION:A pair of parallel flat plate electrodes 11A, 11B are arranged in a space 20 in which a He gas is enclosed. A permanent magnet 15 for applying a magnetic field in the vertical direction is provided between the parallel flat plate electrodes 11A, 11B. Thereby, a travel distance by spiral movement of ionized He ions and electrons increases; as the result, the probability of ionization becomes large and generated current increases.
申请公布号 JPH02130494(A) 申请公布日期 1990.05.18
申请号 JP19880283894 申请日期 1988.11.11
申请人 FUJITSU LTD 发明人 ITAKURA TORU
分类号 G01T1/185;G01T1/29 主分类号 G01T1/185
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