| 摘要 |
PURPOSE:To facilitate the testing at the fine timing and the condition setting of the I/O prior to the testing while the adjustment of a test timing by a test program is made unnecessary by providing a device condition control data storing part or the like. CONSTITUTION:When the processing of a test program 103 is started, device condition control data Da to control the condition setting of the device are sent to a simulated I/O 104 and stored into a device condition control data storing part 107. Next, the I/O 104 becomes an activation waiting condition, and when the input/output activation for testing is executed, the processing such as the activation contents analysis is executed by an input/output action control part 106. Namely, the data Da are read and decoded from the storing part 107 and a device condition S1 to execute the input/output action is set. In the condition S1, the input/output action for the testing is executed by a timing P1 and the result is reported and checked to the test program. Thus, the adjustment of the timing by the test program is made unnecessary and the testing, etc., at the fine timing can be facilitated. |
