发明名称 |
Apparatus and method for optical measuring and imaging of electrical potentials |
摘要 |
An apparatus and method include using an electro-optic crystal lying on a component surface, the crystal being coated with a cooperating electrode which is transparent to a sampling laser beam to optically measure and image electrical potentials and voltage levels independently of topographical influences.
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申请公布号 |
US4926043(A) |
申请公布日期 |
1990.05.15 |
申请号 |
US19880155103 |
申请日期 |
1988.02.11 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
SOELKNER, GERALD |
分类号 |
G01R15/24;G01N21/21;G01N21/956;G01R19/00 |
主分类号 |
G01R15/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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