发明名称 Apparatus and method for optical measuring and imaging of electrical potentials
摘要 An apparatus and method include using an electro-optic crystal lying on a component surface, the crystal being coated with a cooperating electrode which is transparent to a sampling laser beam to optically measure and image electrical potentials and voltage levels independently of topographical influences.
申请公布号 US4926043(A) 申请公布日期 1990.05.15
申请号 US19880155103 申请日期 1988.02.11
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SOELKNER, GERALD
分类号 G01R15/24;G01N21/21;G01N21/956;G01R19/00 主分类号 G01R15/24
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