发明名称 |
Shorted-anode semiconductor device and methods of making the same. |
摘要 |
<p>A semiconductor device includes a substrate (21) of a first conductivity type. A first layer (22) of a second conductivity type is formed on one surface of the substrate (21) of the first conductivity type. A second layer (23) of the first conductivity type is formed on the first layer (22) of the second conductivity type. A third layer (24) of the first conductivity type is selectively formed on the other surface of the substrate (21) of the first conductivity type. A fourth layer (25) of the second conductivity type is formed on the other surface of the substrate (21) of the first conductivity type. The vertical dimension of the fourth layer (25) falls within a range of 5 to 20 mu m and is smaller than that of the first layer (22).</p> |
申请公布号 |
EP0366916(A2) |
申请公布日期 |
1990.05.09 |
申请号 |
EP19890117033 |
申请日期 |
1989.09.14 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MATSUDA, HIDEO C/O INTELLECTUAL PROPERTY DIVISION;YOSHIDA, TAKEOMI C/O INTELLECTUAL PROPERTY |
分类号 |
H01L21/332;H01L29/08 |
主分类号 |
H01L21/332 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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