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发明名称
METHOD AND JIG FOR MEASURING CHARACTERISTIC OF ELECTRONIC PARTS
摘要
申请公布号
JPH02122275(A)
申请公布日期
1990.05.09
申请号
JP19880274379
申请日期
1988.11.01
申请人
HITACHI COMMUN SYST INC
发明人
MOMOKI HIROMITSU
分类号
G01R31/26;G01R31/00
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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