| 摘要 |
PURPOSE:To quantity the component to be measured in a plating solution with good accuracy by diluting a sample solution containing a background element having a fluorescent X-ray spectrum not interfering with the component to be measured in a Zn-type plating solution. CONSTITUTION:The sample solution of a sample collecting part 5 is diluted with a solution containing one or more kind of an element selected from a group consisting of Mo, Sn and Sb having a fluorescent X-ray spectrum not interfering with a component to be measured. Subsequently, a definite amount of the diluted sample solution is weighed by a sample weighing part 8 and dripped on filter paper by a dripping part 9 to be dried. Then, the filter paper is irradiated with X-rays in the X-ray irradiation part 10 of a fluorescent X-ray analyzer 2 and the content of the component to be measured in calculated on the basis of the ratio of the fluorescent X-ray intensity of the component to be measured and that of a background element by an analytical part 11. By this method, the component to be measured in a plating solution can be quantified with good accuracy. |
