Non-contact testing of photovoltaic detector arrays

摘要

The present method for non-contact testing of infrared photovoltaic detectors employs a probe which is positioned a distance "d" from a detector contact to form a capacitance between the probe and the detector. The probe signal is amplified by a preamplifier and the diode is excited both electrically, through the common contact, and optically with a known infrared signal. The probe position is controlled by measuring the probe to detector capacitance. Electrical and electro-optical detector parameters can be determined using standard AC circuit analysis techniques.