| 摘要 |
PURPOSE:To continuously compensate the variation of a light source by comparing the brightness intensity of an added internal standard element due to a sequential type spectroscope for elemental analysis with that of an internal standard element due to a fixed channel type spectroscope. CONSTITUTION:A sample solution is atomized to be introduced into a plasma torch T and the brightness intensity of every element is measured by a sequential type spectroscope Ms and that of an internal standard element is measured by a fixed channel type spectroscope Mc. When an internal standard element is added, the brightness intensity of the added internal standard element is measured by the spectroscope Ms and the ratio with the intensity of the internal standard element simultaneously obtained at that time by the spectroscope Mc is calculated and, further, the brightness intensity of the added element is calculated from the intensity of the internal standard substance obtained at the time of the measurement of other element by the spectroscope Mc. By this method, the variation of a light source can be compensated on the basis of the added element and highly accurate spectroanalysis can be performed economically. |
