发明名称 |
Scanning ion conductance microscope |
摘要 |
A scanning ion conductance microscope, SICM, which can image the topography of soft non-conducting surfaces covered with electrolytes by maintaining a micropipette probe at a constant conductance distance from the surface. It can also sample and image the local ion currents above the surfaces by scanning the micropipette probe in a plane located at a constant distance above the surface. Multiple micropipettes mounted in a multi-barrel head and containing various ion specific electrodes allow simultaneous scanning for different ion currents.
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申请公布号 |
US4924091(A) |
申请公布日期 |
1990.05.08 |
申请号 |
US19890305465 |
申请日期 |
1989.02.01 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
HANSMA, PAUL K.;DRAKE, BARNEY |
分类号 |
G01N27/416;G01N27/49;G01Q10/06;G01Q20/00;G01Q30/04;G01Q30/20;G01Q60/44 |
主分类号 |
G01N27/416 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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