发明名称 |
Apparatus for measuring the hysteresis loop of magnetic film |
摘要 |
A magneto-optic Kerr effect hysteresis loop measuring apparatus is provided which employs a pair of pole-pieces of the same magnetic polarity providing a high and uniform magnetic field strength in the gap between the oppositely disposed faces of the pole-pieces. The spot on the product which is to be nondestructively tested is placed in the gap between the pole-pieces in a region of uniform saturating magnetic field. A laser beam having a high polarization ratio is directed along an incident path with a spot on the surface of the product to be nondestructively tested, and a reflected beam is processed in a Kerr effect detector to provide hysteresis loop data. This data is capable of providing information sufficient to determine the squareness of the hysteresis loop and the coercivity of high coercivity material being nondestructively tested.
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申请公布号 |
US4922200(A) |
申请公布日期 |
1990.05.01 |
申请号 |
US19890398407 |
申请日期 |
1989.08.25 |
申请人 |
LDJ ELECTRONICS, INC. |
发明人 |
JACKSON, LEON D.;MORRIS, DAN O.;NAGI, THOMAS J. |
分类号 |
G01R33/032;G01R33/12;G01R33/14;G11B5/84 |
主分类号 |
G01R33/032 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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