GATE CIRCUIT FOR ULTRASONIC FLAW DETECTOR

摘要

PURPOSE:To detect a size and a position of a defect of an object to be inspected accurately by detecting a maximum of an echo signal within a desired time range and latching an output value of an address counter as the maximum is generated. CONSTITUTION:With the radiation of an ultrasonic wave from a probe 2 by a pulse of a transmitting section 3, an echo signal is converted into digital from analog and a data is outputted to a waveform memory 6 and a gate circuit 21. The memory 6 stores a data and counts addresses sequentially. The circuit 21 latches the data and when a gate timing signal is outputted, it detects a maximum among the data latched to latch it together with the current address counts. Then, the maximum within a specified time range and the current address counts are detected to be supplied to a CPU 10. This enables the learning of a size and a position of a defect or the like of an object to be inspected accurately.