| 摘要 |
PURPOSE:To increase the produced amount of sample ions greatly, and improve the sensitivity of a mass spectrograph or an ionization detector exceptionally from that of the conventional one by fixing a sample to a holding member having many projections, and applying a high voltage to said holding member. CONSTITUTION:Since a sample is fixed to and held by a member having a number of pin-line projections 21, to which a high voltage is applied, an exceptionally strong electric field exists around the projections 21, and the sample surface is exposed to the strong electric field. Therefore, molecules of the sample, after receiving the energy of Ar* (11.55eV or 11.72eV) by touching Ar*, are immediately ionized, and rapidly eliminated from the surface due to the strong electric field. As a result, a remarkably increased amount of sample ions can be eliminated by the application of the high voltage, compared to the amount of sample ions eliminated when the same amount of Ar* is applied without any application of high voltage. In addition, in this invention, since the sample is fixed to and held by the many pin-like projections 21, the surface area of the sample (the contact area between Ar* and the sample) is increased, and the produced amount of sample ions is increased in this connection too. |
