Semiconductor integrated circuit having i/o terminals allowing independent connection test.

摘要

A semiconductor integrated circuit comprises a plurality of input/output terminals, a test mode input circuit having a mode setting input and for generating a mode control signal, a plurality of test buffer circuits provided for the input/output terminals in one-to-one relation and each having a first terminal connected to a corresponding input/output terminal and a second terminal connected to receive a signal to be supplied to the corresponding input/output terminal or to output a signal inputted through the corresponding input/output terminal. Each test buffer circuit also includes a mode control input connected to receive the mode control signal from the test mode input circuit. When the mode control signal is in a first condition, each test buffer circuit operates to supply a predetermined logical signal to the corresponding input/output terminal so that the predetermined logical signal is outputted from all the input/output terminals. When the mode control signal is in a second condition different from the first condition, each test buffer circuit operates to output a signal supplied to the first or second terminal to the second or first terminal.