发明名称 GATE PROTECTION CIRCUIT FOR ISOLATED GATE TYPE TRANSISTOR
摘要 PURPOSE:To prevent electrostatic breakdown from generation by connecting a room temperature superconductor between the gate and the source of a power MOSFET, and placing a heater warming the room temperature superconductor at a location close to the room temperature superconductor. CONSTITUTION:Since the room temperature superconductor 9 connecting to the gate 4 and the source 2 of the power MOSFET 10 has a zero electric resistance at all times at room temperature, even if a high level static electricity is applied to the gate 4, it cannot exceed the breakdown voltage of the input capacitance of the power MOSFET 10. Moreover, a DC power supply 11 is connected to input terminals 7, 8 of a heater 6 and when the room temperature superconductor 9 is heated to a critical temperature of superconduction by supplying a current to the heater 6, the resistance of the room temperature superconductor is restored to a value corresponding to the input impedance of the power MOSFET 10, the circuit is acted normally. Thus, the breakdown of an oxide film and a semiconductor element due to static electricity is not caused and the handling is simplified.
申请公布号 JPH02113718(A) 申请公布日期 1990.04.25
申请号 JP19880266153 申请日期 1988.10.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 KAMAKURA TAKAYUKI
分类号 H01L25/16;H01L21/8234;H01L27/088;H01L29/78;H02H7/20;H03K17/08;H03K17/92 主分类号 H01L25/16
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