发明名称 ELECTRODE FORMATION OF SILICON CARBIDE SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To form an electrode in n-type SiC capable of firm wire-bonding process by a method wherein an Au/Ni electrode film is laminated on an n-type silicon carbide to be heat-treated at high temperature and then an Au/Cr electrode film is laminated on the Au/Ni electrode to be heat-treated at low temperature. CONSTITUTION:In order to form an ohmic electrode on an n-type silicon carbide 1, an Au/Ni electrode 4 is laminated on the n-type silicon carbide 1 to be heat- treated at high temperature. Next, an Au/Cr electrode film 6 is laminated on the said heat treated Au/Ni electrode film 4 to be heat-treated at low temperature. For example, 5000Angstrom thick Ni and 5000Angstrom thick Au are deposited on the n-type SiC substrate 1 by vacuum evaporation to form the Au/Ni electrode film 4, which is then heat-treated at 1000 deg.C for around 5 minutes. Next, after surface-processing in HF, an Au/Si electrode film 5 is formed on p-type SiC layer 3 to be heat-treated at 950 deg.C. Finally, 500Angstrom thick Cr and 5000Angstrom thick Au are deposited on the Au/Ni electrode film 4 by vacuum evaporation to form the Au/Cr electrode film 6, which is then heat-treated at 500 deg.C for around 20 minutes.
申请公布号 JPH02110922(A) 申请公布日期 1990.04.24
申请号 JP19880263105 申请日期 1988.10.19
申请人 SANYO ELECTRIC CO LTD 发明人 OTA KIYOSHI;NAKADA TOSHITAKE;FUJIKAWA YOSHIHARU
分类号 H01L21/28;H01L33/34;H01L33/40 主分类号 H01L21/28
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