发明名称 LASER BEAM SCANNER
摘要 PURPOSE:To electrically scan a laser beam by forming an optical wave guide having a quantum well structure and a chirp type grating on a substrate and impressing an electric field to the quantum well structure. CONSTITUTION:The laser beam scanner is composed of an optical wave guide 12 having a quantum well structure 14, a chirp type grating 16, a pair of electrodes 18 and 19, etc., provided on a substrate 11. Consequently, when a laser beam L1 outgoing in a direction parallel to the surface of the substrate 11 (a Z direction) is made incident from one edge of the optical wave guide 12 to the internal part of the scanner, the incident light L1 is emitted in a direction intersecting orthogonally with to the surface of the substrate (a Y direction), a converging position P of the outgoing light L2 is determined based on the refractive indices of respective parts to compose the optical wave guide 12 and the cycle of the chirp type grating 16, and since the refractive index of the quantum well structure 14 being a part of the optical wave guide 12 largely changes when the electric field is impressed between both electrodes 18 and 19, the converging position of the outgoing light L2 changes. Thus, the converging position of the laser beam can be changed electrically and continuously.
申请公布号 JPH02110435(A) 申请公布日期 1990.04.23
申请号 JP19880263453 申请日期 1988.10.19
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 MAKINO TOSHIHIKO
分类号 G02F1/295;H01S3/101;H01S5/00;H01S5/042;H01S5/062 主分类号 G02F1/295
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