发明名称 SETTING DEVICE OF COMPONENT OF TESTER
摘要 PURPOSE:To simplify operations for setting and removing a chip component and to enable application of a device to chip components having different dimensions and shapes by a construction wherein a fixed holding piece is fixed on the upper surface of a base block in each accommodation space. CONSTITUTION:A movable holding piece 23 faces a fixed holding piece 22 with a chip component 1 held between in each accommodation space, and it is joined to a longitudinal beam member through the intermediary of a coil spring 25. The holding piece 23 is moved in the direction of separation from the holding piece 22 by the spring 25 acting as a tension coil spring. Therefore a large space can be formed between the holding pieces 22 and 23 and the component 1 can be put on a base block so that a base having an electrode 2 formed is brought into contact with the upper surfaces of a fixed-side electrode plate 32 and a movable-side electrode plate 33 corresponding thereto. When an opening-closing cover 30 is closed, a leaf spring 31 fitted oppositely to each accommodation space presses the component 1 onto the upper surface 11A side of the base block. Accordingly, the electrode 2 of the component 1 comes into close contact with the electrode plate 32 or 33 corresponding thereto and the electrode 2 is connected to the main body of a tester through a connection wire 8.
申请公布号 JPH02107978(A) 申请公布日期 1990.04.19
申请号 JP19880260974 申请日期 1988.10.17
申请人 FUJITSU LTD 发明人 KITO AKIHITO
分类号 G01R31/00;H01C17/00;H01G13/00 主分类号 G01R31/00
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