发明名称 Semiconductor devices manufacture using selective epitaxial growth and poly-Si deposition in the same apparatus.
摘要 <p>A semiconductor device and its manufacturing method are provided in which an epitaxial silicon layer (5) is formed by a selective epitaxial growth method over a semiconductor substrate (1) and a polysilicon layer (6) is formed by an ordinary deposition method on the epitaxial silicon layer (5) and these layers (5) and (6) are formed over a semiconductor device in a continuous process within the same furnace for a CVD apparatus.</p>
申请公布号 EP0363689(A2) 申请公布日期 1990.04.18
申请号 EP19890117315 申请日期 1989.09.19
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YOSHIKAWA, SUSUMU, INTELLECTUAL PROPERTY DIVISION;SAMATA, SHUICHI, INTELLECTUAL PROPERTY DIVISION;MAEDA, SATOSHI, INTELLECTUAL PROPERTY DIVISION;SAWADA, SHIZUO, INTELLECTUAL PROPERTY DIVISION
分类号 H01L21/20;H01L21/205;H01L21/28;H01L21/285;H01L21/768;H01L29/43 主分类号 H01L21/20
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