发明名称 Plasma etching apparatus.
摘要 <p>A plasma etching apparatus comprising a treatment chamber (8) capable of being evacuated, an electrode structure comprising first and second electrodes (4 and 6) which face each other in the treatment chamber and a gas introducing means (2) provided in connection with the first electrode, and a radiofrequency power source (7) connected to the electrode structure for supplying radiofrequency electric power to a space between the gas introducing means and the second electrode. The gas introducing means comprises a graphite panel (22) having a silicide layer (23) formed at least on the surface of graphite facing the second electrode and has a large number of through-holes (3) for passing therethrough a gas fed to a space between the first electrode and the introducing means into the space between the gas introducing means and the second electrode.</p>
申请公布号 EP0364215(A2) 申请公布日期 1990.04.18
申请号 EP19890310354 申请日期 1989.10.10
申请人 ANELVA CORPORATION 发明人 TSUKADA, TSUTOMU C/O ANELVA CORP.;ASAMAKI, TATSUO C/O ANELVA CORP.
分类号 H01J37/32;H05H1/30;B08B17/02;C01B31/04;H01L21/302;H01L21/3065 主分类号 H01J37/32
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