发明名称 |
Plasma etching apparatus. |
摘要 |
<p>A plasma etching apparatus comprising a treatment chamber (8) capable of being evacuated, an electrode structure comprising first and second electrodes (4 and 6) which face each other in the treatment chamber and a gas introducing means (2) provided in connection with the first electrode, and a radiofrequency power source (7) connected to the electrode structure for supplying radiofrequency electric power to a space between the gas introducing means and the second electrode. The gas introducing means comprises a graphite panel (22) having a silicide layer (23) formed at least on the surface of graphite facing the second electrode and has a large number of through-holes (3) for passing therethrough a gas fed to a space between the first electrode and the introducing means into the space between the gas introducing means and the second electrode.</p> |
申请公布号 |
EP0364215(A2) |
申请公布日期 |
1990.04.18 |
申请号 |
EP19890310354 |
申请日期 |
1989.10.10 |
申请人 |
ANELVA CORPORATION |
发明人 |
TSUKADA, TSUTOMU C/O ANELVA CORP.;ASAMAKI, TATSUO C/O ANELVA CORP. |
分类号 |
H01J37/32;H05H1/30;B08B17/02;C01B31/04;H01L21/302;H01L21/3065 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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