| 摘要 |
PURPOSE:To execute an automatic sorting operation by a method wherein a junction capacity of a P-N diode forming a light-emitting region is measured, a mean value in each chip is found from measured values of individual light-emitting regions and this array is judged and sorted from the mean value on the basis of whether a junction capacity value of each light-emitting region is within a permissible range. CONSTITUTION:It is supposed that the number of light-emitting regions per chip of a light-emitting diode array is 64 pieces. The light-emitting diode array in a wafer state is connected electrically by using an automatic prober 11. A reverse bias of about 5 V is applied to a P-N diode forming each light-emitting region; a measured value Ci of a junction capacity (where i=1, 2,..., 64) between an anode and a cathode is measured by using an automatic capacity measuring instrument 12. The Ci of the P-N diode is directly proportional to a diffusion junction area of the P-N diode; accordingly, it can be thought that the diffusion junction area in 32nd, 33rd and 34th light- emitting regions in the figure is large as compared with that of other light-emitting regions. The Ci of 64 pieces is sent to a computer 13 for processing use via a data line 14; a mean value Ci' of the data and (1+ or -d) Ci' to be used as a judgment standard are computed. After that, it is judged whether the Ci of the 64 pieces is within the standard or not. |
