BUILT-IN TYPE SELF TESTING CIRCUIT,申请号JP19880257737-传众专利搜索

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发明名称	BUILT-IN TYPE SELF TESTING CIRCUIT
摘要
申请公布号	JPH02103481(A)	申请公布日期	1990.04.16
申请号	JP19880257737	申请日期	1988.10.13
申请人	FUJITSU LTD	发明人	SATO TOMIO;YAMASHITA KOICHI
分类号	G01R31/28;H01L21/66;H01L21/822;H01L27/04	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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