PIN PHOTOGRAPHING METHOD IN CASE OF PIN BEND INSPECTION FOR FP TYPE SEMICONDUCTOR,申请号JP19880250701-传众专利搜索

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发明名称	PIN PHOTOGRAPHING METHOD IN CASE OF PIN BEND INSPECTION FOR FP TYPE SEMICONDUCTOR
摘要
申请公布号	JPH0298614(A)	申请公布日期	1990.04.11
申请号	JP19880250701	申请日期	1988.10.04
申请人	KOKUSAI SYST SCI KK	发明人	WATANABE MASATSUGU
分类号	G01B11/24;G01B11/245;G01N21/88;G01N21/956	主分类号	G01B11/24
代理机构		代理人
主权项
地址

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