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发明名称
SOCKET FOR INSPECTION OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH0299876(A)
申请公布日期
1990.04.11
申请号
JP19880252823
申请日期
1988.10.06
申请人
NEC CORP
发明人
YONEZAWA TAKASHI
分类号
G01R31/26;G01R31/28;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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