CHIP TEST CONDITION SELECTION METHOD AND APPARATUS,申请号AU19880013305-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	CHIP TEST CONDITION SELECTION METHOD AND APPARATUS
摘要
申请公布号	AU595692(B2)	申请公布日期	1990.04.05
申请号	AU19880013305	申请日期	1988.03.18
申请人	HONEYWELL BULL INC.	发明人	PETER M. HESLIN
分类号	G06F9/26;(IPC1-7):H01L27/06;G06F7/48;G06F12/00;H01L23/52;H03K17/693	主分类号	G06F9/26
代理机构		代理人
主权项
地址

您可能感兴趣的专利

CHARACTER DISPLAY UNIT

TRANSITION DEVICE FOR CONNECTING COAXIAL CABLE TO WAVEGUIDE

ELEVATOR WAITING TIME INDICATOR

ELEVATOR GROUP MANAGING DEVICE

DEVICE FOR CALCULATING WAITING TIME OF ELEVATOR

VEHICLE EQUIPPED WITH SAFETY SYSTEM

CUSHION MATERIAL AS LAMINATE BOND

MOVING BODY NUMBER IDENTIFICATION SYSTEM

METHOD OF REWINDING ROLLED FILM

Stacked circuit breakers having high interrupting capacity

Rotating pipeline inspection apparatus

Brushless phase locked servo drive

Timing display ignition plate assembly

Automatic control system

Optical tracking system

Continuous loop tape cartridges

Control system and method for removal of coke from a coke oven

Dehydrocyclization with an acidic multimetallic catalytic composite