发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To install an aperture having a taper on a polysilicon layer with excellent reproducibility, and reduce the manufacturing process of a DRAM by performing wet etching after an impurity is introduced into the polysilicon layer. CONSTITUTION:A polysilicon layer 2 is grown on a semiconductor substrate 1; phosphorus is thermally diffused in the layer 2, and then phosphorus is ion- implanted; by laser annealing, ion-implanted phosphorus particle is activated; after a photo resist film 3 is formed, patterning is performed. When the layer 2 is wet-etched by using the film 3 as a mask, an aperture 20 having a taper is formed in the layer 2. Next, the film 3 is eliminated.
申请公布号 JPH0294436(A) 申请公布日期 1990.04.05
申请号 JP19880246020 申请日期 1988.09.29
申请人 NEC CORP 发明人 YOSHIMURA KATSUNOBU
分类号 H01L21/306;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L21/306
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