发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND ITS DATA REWRITING METHOD
摘要 <p>PURPOSE:To surely transmit the potential at a bit line to a selected memory cell by utilizing the electron discharge from a floating gate as an erase mode and electron injection into the floating gate as a writing mode. CONSTITUTION:At the time of erasing the data of memory cells M1-M8, the threshold level is moved toward the negative side by discharging electrons in floating gates 41-48 of the memory cells to a substrate or drain. In other words, data of all memory cells are set to '1'. The erasing operations are performed from the memory cell M1 nearest to a bit line BL. Data writing in the memory cells M1-M8, on the other hand, is performed by moving the threshold level toward the positive side by successively injecting electrons into the floating gates 41-48 from the memory cell M8 farthest from the bit line BL. Therefore, the potential at the bit line can be transmitted surely.</p>
申请公布号 JPH0294197(A) 申请公布日期 1990.04.04
申请号 JP19880246105 申请日期 1988.09.30
申请人 TOSHIBA CORP 发明人 KIRISAWA RYOHEI;SHIRATA RIICHIRO;NAKAYAMA RYOZO;ARITOME SEIICHI;MASUOKA FUJIO;MOMOTOMI MASAKI;ITO YASUO
分类号 G11C17/12;G11C16/04;G11C16/10;G11C17/00 主分类号 G11C17/12
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