发明名称 Method of manufacturing a semiconductor device having tapered pillars
摘要 A method of manufacturing a semiconductor device having multi-layer structure with tapered pillars containing a refractory metal used for connecting interconnection layers. An aluminum containing layer is formed on the semiconductor substrate and a refractory metal (or silicide and nitride) containing layer is formed on the aluminum layer. These two layers are selectively and successively etched to form an interconnection layer having thereon a pattern formed of the refractory metal containing layer. The pattern is selectively etched to remove a portion of the pattern from the interconnection layer and leave a portion on the interconnection layer to thereby form pillars. The tapered portions are formed by isotropic etching.
申请公布号 US4914056(A) 申请公布日期 1990.04.03
申请号 US19880281924 申请日期 1988.12.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OKUMURA, KATSUYA
分类号 H01L21/3205;H01L21/44;H01L21/768;H01L23/522 主分类号 H01L21/3205
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