发明名称 WAFER MANUFACTURING METHOD
摘要 In manufacturing of semiconductor wafer with good flatness in front and rear sides, initially a sigle silicon ingot is cultivated by a diamond tool with 0.2 μm surface roughness. A slicer glade is moved toward the support rod to slice the ingot to obtain wafer with 0.785mm thickness. The wafer cultivating both sides is etched in mixture acid solution comprising HF, HNO3, CH3COOH and rinsed in clean wafer and then dried.
申请公布号 KR900002079(B1) 申请公布日期 1990.03.31
申请号 KR19860007097 申请日期 1986.08.26
申请人 MITSUBISHI METAL CO.LTD.;NIHON SILICON CO.LTD. 发明人 SAITO OUCHI
分类号 H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/00
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