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发明名称
TESTING CIRCUIT
摘要
申请公布号
KR900002494(Y1)
申请公布日期
1990.03.30
申请号
KR19870021566U
申请日期
1987.12.07
申请人
OK HAN-SOK
发明人
OK HAN-SOK
分类号
G05F1/56;(IPC1-7):G05F1/56
主分类号
G05F1/56
代理机构
代理人
主权项
地址
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