发明名称 PARTICLE BEAM MEASURING INSTRUMENT
摘要 PURPOSE:To decrease the possibility of the arrival of the neutral particle which is not affected by a magnetic field at a detector and to allow the execution of the measurement of plasma temp. with higher exactness by deflecting the charged particle drawn out into a space for measurement, passing the particle through a narrow path, deflecting the particle again by the magnetic field, then making the particle incident to the detector. CONSTITUTION:The charged particle is drawn out of plasma 1 by a port 2 for measurement into the space for measurement enclosed by a radiation shielding body 5. The measuring instrument is so constituted that charged particle is deflected by the magnetic field and is passed in the narrow path 10 for the passage of the charged particle formed to the shielding body for shielding neutrons and gamma rays and is made incident to the detector 4 after the particle is deflected again by the magnetic field. The possibility that the neutral particle streaming to the inner side of the particle beam measuring instrument by passing the port 2 for measurement arrives at the detector 4 and disturbs the information of the energy distribution if the charged particle is drastically decreased in this way. The measurement of the plasma temp. with the higher exactness is thus possible.
申请公布号 JPH0288990(A) 申请公布日期 1990.03.29
申请号 JP19880241563 申请日期 1988.09.27
申请人 NIPPON ATOM IND GROUP CO LTD;TOSHIBA CORP 发明人 UEMATSU MIKIO;HATAYAMA AKIMASA
分类号 G01T1/36;H05H1/00 主分类号 G01T1/36
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