| 摘要 |
The essential steps of the method according to the invention for measuring and evaluating the intensity profiles of spots of light, these being laser intensity profiles, here, are as follows: a portion of the energy is coupled out from the beam path of the short-term optical event, and its energy density is digitised or quantised in two spatial directions (preferably orthogonally to the photon incidence). The signal proportional to the light intensity of each digit or quantum is stored. At the same time, the total energy is also determined via the stored spot of light. The light distribution on a surface opposite an axis which is not parallel to said surface is imaged from said information in a following process step. Said one procedure delivers the desired intensity profile, that is to say the energy distribution over the measuring surface, which is incident during the short-term optical event. <IMAGE> |
