发明名称 |
Semiconductor strain gauge bridge circuit |
摘要 |
A semiconductor strain gauge bridge circuit device is disclosed to include a bridge circuit of semiconductor strain gauges, a first zero-point temperature compensation circuit connected to one of a pair of output terminals of the bridge circuit and including a voltage-dividing resistor circuit generating a voltage substantially equal to a potential appearing at the one output terminal at a predetermined temperature, and a second zero-point temperature compensation circuit connected to the other of the output terminals and including a resistive element having a temperature characteristic similar to that of the semiconductor strain gauges.
|
申请公布号 |
US4911016(A) |
申请公布日期 |
1990.03.27 |
申请号 |
US19890310018 |
申请日期 |
1989.02.13 |
申请人 |
HITACHI, LTD. |
发明人 |
MIYAZAKI, ATSUSHI;KOBAYASHI, RYOICHI |
分类号 |
G01B7/00;G01B7/16;G01D3/028;G01L1/22;G01L9/00;G01L9/06;H01L41/00 |
主分类号 |
G01B7/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|