发明名称 Semiconductor strain gauge bridge circuit
摘要 A semiconductor strain gauge bridge circuit device is disclosed to include a bridge circuit of semiconductor strain gauges, a first zero-point temperature compensation circuit connected to one of a pair of output terminals of the bridge circuit and including a voltage-dividing resistor circuit generating a voltage substantially equal to a potential appearing at the one output terminal at a predetermined temperature, and a second zero-point temperature compensation circuit connected to the other of the output terminals and including a resistive element having a temperature characteristic similar to that of the semiconductor strain gauges.
申请公布号 US4911016(A) 申请公布日期 1990.03.27
申请号 US19890310018 申请日期 1989.02.13
申请人 HITACHI, LTD. 发明人 MIYAZAKI, ATSUSHI;KOBAYASHI, RYOICHI
分类号 G01B7/00;G01B7/16;G01D3/028;G01L1/22;G01L9/00;G01L9/06;H01L41/00 主分类号 G01B7/00
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