发明名称 AUTOMATIC INSPECTION DEVICE
摘要 <p>A method of automatically inspecting an object is disclosed which is achieved by the steps of irradiating an object to be inspected, picking up the object by an optical image sensor to provide its video signal, dividing the optical image of the object picked up by the optical image sensor into at least two portions which are mutually symmetrical to each other, and comparing video signals of corresponding parts of the mutually symmetrical portions sequentially to thereby inspect whether the object has a defect or not, which is carried out by an automatic inspection apparatus in which an object to be inspected is irradiated upon by a light source, and then photosensed by an optical image sensor, and the image signal from the image sensor is processed by an electric circuitry or processor to thereby inspect whether the object has a defect or not, wherein the optical image of the object to be inspected which is picked up by the image sensor is divided into at least two parts which are to be mutually symmetric and the image signals of the corresponding parts of the symmetric portions are consecutively compared whereby the defect of the object can be inspected.</p>
申请公布号 CA1267219(A) 申请公布日期 1990.03.27
申请号 CA19850490482 申请日期 1985.09.11
申请人 HAJIME INDUSTRIES LTD. 发明人 YOSHIDA, HAJIME
分类号 G01N21/88;G01N21/93;G06T1/00;(IPC1-7):H04N7/18 主分类号 G01N21/88
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