| 摘要 |
PURPOSE:To simply measure the wavelength of X-rays by arranging substances absorbing X-rays having different wavelengths or plate-shaped materials containing the same in the order of the absorbing wavelengths thereof. CONSTITUTION:An X-ray detector such as an ion bar is placed on the downstream side of metal foils 1-10 to measure the attenuation factor of X-rays. When the diameter of X-rays is large, the relative intensities of X-rays transmitted through the fluorescent plate placed on the downstream side of the metal foils are known. The shapes of the metal foils 1-10 are changed by respective metals and, from the shapes of fluorescence observed on the fluorescent plate, a metal having an absorption edge to which the wavelength of X-rays is nearest is known. That is, by combining materials having different absorbing wavelengths, the absorbing terminals of X-rays can be distributed in the order of absorbing wavelengths and, therefore, a wavelength can be simply measured.
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