发明名称 METHOD AND DEVICE FOR FORMATION INSPECTION
摘要 PURPOSE:To realize accurate formation inspection by detecting the transmission pattern of light as to a specific area of a sheet to be inspected and grasping a formation state as an area. CONSTITUTION:An image pickup device 2 is arranged opposite an illumination device 1, and the beltlike sheet 4 to be inspected is passed between them to detect the quantity of transmitted light in a specific rectangular area 5 as a transmission pattern, whose image data is outputted to the formation measuring instrument 3. The device 3 analyzes the image of the data to extract various feature quantities indicating the features of the formation of the sheet, e.g. a density distribution of the formation and the feature quantities are converted into visible information, which is displayed 18. Consequently, the feature quantities of the formation are extracted from surface information on the sheet 4, so the formation state of the sheet can be grasped and the extent of crowding, etc., of the fiber of the sheet 4 is easily judged, so that the accurate formation inspection is performed.
申请公布号 JPH0282144(A) 申请公布日期 1990.03.22
申请号 JP19880234190 申请日期 1988.09.19
申请人 OMRON TATEISI ELECTRON CO 发明人 NISHIDA TAKESHI;NAITO FUMITSUGU;NISHINO MASAHARU
分类号 G01N21/89;G01N21/86;G01N21/892 主分类号 G01N21/89
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