首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
INSPECTING DEVICE
摘要
申请公布号
JPH0274050(A)
申请公布日期
1990.03.14
申请号
JP19880227224
申请日期
1988.09.09
申请人
TOKYO ELECTRON LTD
发明人
NAGASAKA MUNETOSHI
分类号
G01R31/28;G01R31/00;G01R31/26;H01L21/66
主分类号
G01R31/28
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SOI WAFER AND METHOD FOR PRODUCING SOI WAFER
Container for corrosive liquids
Respiratory mask and method for making the same
Torque support and method for the production thereof
Data transmitting apparatus.
Electric motor
Contents update state monitoring method, apparatus and program
Emission control with scanning beam velocity modulation
Method for digital compression of color images
Variable optical delay line with a micro electro-mechanical system
Protection device for a sensor in a measuring device
Production of passive devices
Structural support
Polyester resin and its production process
Apparatus for opening swing-stopper bottles
Device for towing a bicycle
Sewing machine
Pneumatic sheet guiding device in a printing press
Method and apparatus for producing corrugated paperboard with at least four layers
Apparatus for clean grinding of scaled hotband