发明名称 Method of measuring period of surface defect.
摘要 <p>In a method of measuring a period on which a surface defect appears in a surface of a web-like material moving in a lengthwise direction, surface defects distributed in the surface are detected in a lengthwise direction of the web-like material. Positional data and distance data of the detected surface defects relative to one another are collected for a predetermined length of the web-like material. The web-like material is decided to have a periodic surface defect appearing on a period between predetermined maximum and minimum periods when the distance data includes a distance equivalent to an elemental period that is integer multiples of a fundamental period.</p>
申请公布号 EP0358236(A2) 申请公布日期 1990.03.14
申请号 EP19890116688 申请日期 1989.09.08
申请人 FUJI PHOTO FILM CO., LTD. 发明人 KISO,TAKESHI C/O FUJI PHOTO FILM CO., LTD.;MASUDA, TAKANORI C/O FUJI PHOTO FILM CO., LTD.
分类号 G01N21/89;G01B11/30;G01N21/88;G01N21/892 主分类号 G01N21/89
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