发明名称 |
Method of measuring period of surface defect. |
摘要 |
<p>In a method of measuring a period on which a surface defect appears in a surface of a web-like material moving in a lengthwise direction, surface defects distributed in the surface are detected in a lengthwise direction of the web-like material. Positional data and distance data of the detected surface defects relative to one another are collected for a predetermined length of the web-like material. The web-like material is decided to have a periodic surface defect appearing on a period between predetermined maximum and minimum periods when the distance data includes a distance equivalent to an elemental period that is integer multiples of a fundamental period.</p> |
申请公布号 |
EP0358236(A2) |
申请公布日期 |
1990.03.14 |
申请号 |
EP19890116688 |
申请日期 |
1989.09.08 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
KISO,TAKESHI C/O FUJI PHOTO FILM CO., LTD.;MASUDA, TAKANORI C/O FUJI PHOTO FILM CO., LTD. |
分类号 |
G01N21/89;G01B11/30;G01N21/88;G01N21/892 |
主分类号 |
G01N21/89 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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