发明名称 PORTABLE ELECTRO-CIRCUIT TESTING APPARATUS
摘要 The tester tests the connection or logical operation states of the electronic parts with a display as well as an audio sound. The tester includes a logic level discriminator (1) for classfying the testing logic device to TTL or CMOS one, a resistance discriminator (2) for measuring the resistance of the testing device, a test mode selection switch (SWA) for selecting the test mode from the resistance or logical device mode, a lamp circuit (5) for turning on or off the lamp according to the pulse provided from a pulse input detection circuit (4), and a oscillation control circuit (6) for providing the audio sound when the testing device is faulty.
申请公布号 KR900001467(B1) 申请公布日期 1990.03.12
申请号 KR19870009233 申请日期 1987.08.22
申请人 PARK, CHONG-GUK 发明人 PARK, CHONG-GUK
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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