发明名称 |
MOS TRANSISTOR MANUFACTURING METHOD |
摘要 |
The manufacturing method for a MOS transistor for high density and low leakage current includes the following steps; (a) forming a field oxide film (17) by wet oxidation method and an active region (16) on the surface of a Bionimplanted Si substrate (18); (b) forming self- alined source/drain as using the oxide film (19) formed on (18) and P, AS ion implanted polysilicon (20); (c) forming sidewall polysilicon (21) to connect the n-LDD region (25) by reactive ion etching the surface of (20), (18); (d) forming a gate oxide (24) and a gate electrode (23) by using the dry oxidation of the surface of (16), (21).
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申请公布号 |
KR900001399(B1) |
申请公布日期 |
1990.03.09 |
申请号 |
KR19870014846 |
申请日期 |
1987.12.23 |
申请人 |
KOREA INSTITUTE OF ELECTRONIC AND COMMUNICATION;KOREA ELECTRIC COMMUNICATION CORP |
发明人 |
RYU CHONG-SEON;KANG SANG-WON |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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