发明名称 MOS TRANSISTOR MANUFACTURING METHOD
摘要 The manufacturing method for a MOS transistor for high density and low leakage current includes the following steps; (a) forming a field oxide film (17) by wet oxidation method and an active region (16) on the surface of a Bionimplanted Si substrate (18); (b) forming self- alined source/drain as using the oxide film (19) formed on (18) and P, AS ion implanted polysilicon (20); (c) forming sidewall polysilicon (21) to connect the n-LDD region (25) by reactive ion etching the surface of (20), (18); (d) forming a gate oxide (24) and a gate electrode (23) by using the dry oxidation of the surface of (16), (21).
申请公布号 KR900001399(B1) 申请公布日期 1990.03.09
申请号 KR19870014846 申请日期 1987.12.23
申请人 KOREA INSTITUTE OF ELECTRONIC AND COMMUNICATION;KOREA ELECTRIC COMMUNICATION CORP 发明人 RYU CHONG-SEON;KANG SANG-WON
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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