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发明名称
TESTING DEVICE FOR SEMICONDUCTOR CIRCUIT
摘要
申请公布号
JPH0266476(A)
申请公布日期
1990.03.06
申请号
JP19880217921
申请日期
1988.08.31
申请人
NEC KYUSHU LTD
发明人
HIROTA MASAHIRO
分类号
G01R31/26;G01R31/28;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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