| 摘要 |
PURPOSE:To achieve a lower cost of the apparatus with a reduction in the number of flaw detection mechanisms by arranging a flaw detection mechanism to detect flaws at a top end, a bottom end and an edge end on the anti-reference side of a steel plate and a flaw detection mechanism to detect flaws at an edge end on the reference side and at the center thereof. CONSTITUTION:A Y-scan flaw detector which detects flaws with a group of probes by scanning in a direction parallel with that of conveying a steel plate 1 to be inspected is made up of an inside flaw detection mechanism device 2 having a group of probes I1-In to detect flaws at the center of the steel plate 1 and an edge flaw detection mechanism device 5 having a group of probes TB for detecting flaws at a top end and bottom end thereof and having a group of probes E2 for detecting flaws at an edge on the anti-reference side thereof to detect flaws at a plate end opposite to the reference conveyance side at the tip rear and across the width along the length of the steel plate. Then, a holding mechanism for the probe I1 arranged right on the reference conveyance side is used among a plurality of probe holding mechanisms having the inside flaw detection mechanism device 2 to detect flaws at ends of the steel plate on the reference conveyance side across the width thereof 1. |
