| 摘要 |
<p>PURPOSE:To prevent destruction of an insulating film and, at the same time, to make inspection for a defect possible by alternately connecting signal lines of a switching element with each other by plural lines with metallic films, and connecting the patterns of the metallic films formed on the outside of the input terminals of the signal lines and the signals line groups with semiconductor films. CONSTITUTION:Scanning signal lines X1-Xm and video signal lines Y1-Yn of the switching element of an active matrix substrate are alternately connected with each other by plural lines with metallic films 3 formed on the glass base plate. Moreover, common electrode patterns 4 formed on the outside of the input terminals 2 are connected with the signal line groups respectively composed of plural signal lines connected with each other by means of semiconductor films 5. Therefore, destruction of an insulating film due to static electricity on the active matrix substrate can be prevented and, at the same time, the disconnecting defect of the signal lines and short-circuiting defect of the scanning and video signal line groups X1-Xm and Y1-Yn which are respectively composed of plural lines connected with each other can be inspected.</p> |
