发明名称 Process for making self-aligned contacts.
摘要 <p>A process for making metal contacts and interconnection lines which are self-aligned to each other is disclosed. After semiconductor devices are formed and an insulating/planarizing layer is deposited, a layer of polyimide is deposited. A pattern of trenches into which the metal interconnection lines will be deposited is formed in the polyimide layer. Next, a pattern of contacts to the underlying semiconductor devices is formed in a photoresist layer. This pattern of contacts is subsequently etched into the insulating/planarizing layer. Since both the patterned photoresist layer and the patterned polyimide layer are used as etch masks, thc contact windows through the insulating/planarizing layer and the trenches in the polyimide layer will be aligned with respect to each other. After metal deposition, the metal contacts and interconnection lines will be self-aligned.</p>
申请公布号 EP0355339(A2) 申请公布日期 1990.02.28
申请号 EP19890112163 申请日期 1989.07.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 STANASOLOVICH, DAVID;PETERMAN, STEVEN
分类号 H01L21/60;H01L21/768 主分类号 H01L21/60
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