TESTING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT,申请号JP19880210169-传众专利搜索

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发明名称	TESTING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH0258352(A)	申请公布日期	1990.02.27
申请号	JP19880210169	申请日期	1988.08.24
申请人	FUJITSU LTD	发明人	SHIKATANI JUNICHI
分类号	H01L21/822;H01L21/66;H01L21/82;H01L27/04;H01L27/118	主分类号	H01L21/822
代理机构		代理人
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