发明名称 |
DEPOSITION METHOD OF POLY-SILICON |
摘要 |
The forming method of a poly-silicon for decreasing the contact resistance between the silicide layer and the second polysilicon layer has the following steps: (a) evacuating the reaction tube at the first temperature to prevent the thermal oxidation; (b) injecting the nitrogen gas in the reaction tube and increasing the temperature from the first temperature to the second temperature for forming a poly-silicon; (c) forming the poly-silicon at the second temperture; (d) eliminating the gas from the reaction tube and decreasing the temperature from the second temp. to the first temp.; (e) exposing the semiconductor substrate in the reaction tube at the first temp.
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申请公布号 |
KR900001064(B1) |
申请公布日期 |
1990.02.26 |
申请号 |
KR19870010934 |
申请日期 |
1987.09.30 |
申请人 |
SAMSUNG ELECTRONICS CO.LTD. |
发明人 |
KIM YOUNG-GEUN;KIM HO-JIN;KIM SEOK-GYU |
分类号 |
H01L21/283;H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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