发明名称 DEPOSITION METHOD OF POLY-SILICON
摘要 The forming method of a poly-silicon for decreasing the contact resistance between the silicide layer and the second polysilicon layer has the following steps: (a) evacuating the reaction tube at the first temperature to prevent the thermal oxidation; (b) injecting the nitrogen gas in the reaction tube and increasing the temperature from the first temperature to the second temperature for forming a poly-silicon; (c) forming the poly-silicon at the second temperture; (d) eliminating the gas from the reaction tube and decreasing the temperature from the second temp. to the first temp.; (e) exposing the semiconductor substrate in the reaction tube at the first temp.
申请公布号 KR900001064(B1) 申请公布日期 1990.02.26
申请号 KR19870010934 申请日期 1987.09.30
申请人 SAMSUNG ELECTRONICS CO.LTD. 发明人 KIM YOUNG-GEUN;KIM HO-JIN;KIM SEOK-GYU
分类号 H01L21/283;H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/283
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