发明名称 LOGIC CIRCUIT HAVING A TEST DATA LOADING FUNCTION
摘要 The logic circuit includes test data terminal in JK flip-flop circuit which comprises a first-stage logic circuit having two input terminals for receiving an input data resepctively. A second-stage logic circuit has an input connected to the output of the first-stage logic circuit and further has a clock signal input terminal for receiving a clock signal. There is a noninverted signal output terminal, and an inverted signal output terminal. The first-stage logic circuit operatively selects either the test data or the first and second input data in response to the enable signal, and the selected data is latched in the second-stage logic circuit in response to the clock signal.
申请公布号 KR900000995(B1) 申请公布日期 1990.02.23
申请号 KR19860003366 申请日期 1986.04.30
申请人 FUJITSU CO.LTD. 发明人 SKIHARA DAKANORI
分类号 G01R31/3185;H03K3/037;(IPC1-7):H03K19/00 主分类号 G01R31/3185
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