发明名称 PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To stably form fine hole-shaped resist patterns by removing a negative type photoresist material coated with the other negative type photoresist material to the thickness at which a positive type photoresist is exposed and selectively removing the patterns. CONSTITUTION:The hole-shaped positive type photoresist patterns 1 are formed on a substrate 2. The patterns 1 are coated with the negative type photoresist material 3. The isoprene rubber type negative type photoresist is used for the material 3 and the film is formed by a spin coating method. The material 3 is then removed until the patterns 1 are exposed. The positive type photoresist 1 is removed and the hole-shaped patterns are formed of the resist material 3 on the substrate 2 when the entire surface of the surface exposed with the resist 1 is irradiated with UV light. The fine hole-shaped resist patterns are formed in this way.
申请公布号 JPH0253060(A) 申请公布日期 1990.02.22
申请号 JP19880205182 申请日期 1988.08.18
申请人 MATSUSHITA ELECTRON CORP 发明人 TAKASHIMA YUKIO;FUKUMOTO HIROBUMI;OKUMA TORU;OKUDA YOSHIMITSU
分类号 G03F7/20;G03F7/26;H01L21/027 主分类号 G03F7/20
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