发明名称 |
PRODUCTION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To stably form fine hole-shaped resist patterns by removing a negative type photoresist material coated with the other negative type photoresist material to the thickness at which a positive type photoresist is exposed and selectively removing the patterns. CONSTITUTION:The hole-shaped positive type photoresist patterns 1 are formed on a substrate 2. The patterns 1 are coated with the negative type photoresist material 3. The isoprene rubber type negative type photoresist is used for the material 3 and the film is formed by a spin coating method. The material 3 is then removed until the patterns 1 are exposed. The positive type photoresist 1 is removed and the hole-shaped patterns are formed of the resist material 3 on the substrate 2 when the entire surface of the surface exposed with the resist 1 is irradiated with UV light. The fine hole-shaped resist patterns are formed in this way. |
申请公布号 |
JPH0253060(A) |
申请公布日期 |
1990.02.22 |
申请号 |
JP19880205182 |
申请日期 |
1988.08.18 |
申请人 |
MATSUSHITA ELECTRON CORP |
发明人 |
TAKASHIMA YUKIO;FUKUMOTO HIROBUMI;OKUMA TORU;OKUDA YOSHIMITSU |
分类号 |
G03F7/20;G03F7/26;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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