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发明名称
SEMICONDUCTOR TESTING DEVICE
摘要
申请公布号
JPH0252263(A)
申请公布日期
1990.02.21
申请号
JP19880204111
申请日期
1988.08.17
申请人
SEIKO INSTR INC
发明人
TAKAHASHI KENICHI
分类号
G01R31/26;G01R31/28
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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