发明名称 Semiconductor power device integrated with temperature protection means
摘要 The present invention relates to a semiconductor device employed for high power use and a method of manufacturing the same. According to the present invention, a temperature detecting device is formed on the same substrate with a power device. Thus, there is no need to add an external temperature sensor, whereby the device can be reduced in size. Further, an abnormal temperature of the power device is accurately detected by the temperature detecting device, whereby thermal breakdown of the power device is reliably prevented.
申请公布号 US4903106(A) 申请公布日期 1990.02.20
申请号 US19880202469 申请日期 1988.06.06
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 FUKUNAGA, MASANORI;MAJUMDAR, GOURAB
分类号 H01L27/02;H01L27/04;H01L29/08;H01L29/10;H01L29/78;H02H5/04;H03K17/14 主分类号 H01L27/02
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