发明名称 |
METHOD OF MANAGING PRODUCTION OF SEMICONDUCTOR WAFER AND WAFER CARRIER JIG FOR SUCH MANAGEMENT |
摘要 |
<p>PURPOSE:To make it possible to grasp progress of processes on the basis of a number of wafers by transferring an identification mark representing a treating process on a marginal region of a semiconductor wafer where products are not affected thereby. CONSTITUTION:Each time a semiconductor wafer 1 is treated in an exposure process, at least a mark indicating a type of products and a number of the wafer and a mark 3 indicating that the related process has been finished are put on a region close to an orientation flat 2 where chips on the wafer 1 for providing the products are not affected thereby. The identification mark 3 is transferred and engraved by photolithography. The transferred identification mark 3 is read in the following treating processes so that the semiconductor wafers 1 are identified on the basis of a number of wafers. In this manner, it is possible to indicate conditions of physical distribution and manufacture on the basis of a number of wafers as well as to manage working achievements and working results on the basis of a number of wafers.</p> |
申请公布号 |
JPH0242709(A) |
申请公布日期 |
1990.02.13 |
申请号 |
JP19880192060 |
申请日期 |
1988.08.02 |
申请人 |
HITACHI LTD |
发明人 |
TSUYAMA TSUTOMU;IWASAKI TAKEMASA;NAKAZATO JUN;SHIMOSHA SADAO;OTANI HARUO |
分类号 |
H01L21/673;H01L21/02;H01L21/027;H01L21/30;H01L21/68 |
主分类号 |
H01L21/673 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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